@inproceedings{731c90da44684e1c91dd7f60642f5fe3,
title = "Prediction of interface dielectric relaxations in bimodal brush functionalized epoxy nanodielectrics by finite element analysis method",
abstract = "Finite element 2-D analysis was implemented to simulate the dielectric spectra of nanodielectrics. As a test case, silica modified with a high graft density of short molecules and a low graft density of epoxy compatible chains were incorporated into epoxy. TEM images of the composites filler distribution were used to construct the model geometry with the interfacial area specifically included. The interfacial area was found to have dielectric relaxation behavior different from that of the matrix, as described by additional fitting parameters. This modeling method has the potential to improve our understanding of the impact of interface properties on the dielectric properties of composites.",
author = "Yanhui Huang and Krentz, {Timothy M.} and Nelson, {J. Keith} and Schadler, {Linda S.} and Yang Li and He Zhao and Brinson, {L. Catherine} and Michael Bell and Brian Benicewicz and Ke Wu and Breneman, {Curt M.}",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014 ; Conference date: 19-10-2014 Through 22-10-2014",
year = "2014",
month = dec,
day = "22",
doi = "10.1109/CEIDP.2014.6995897",
language = "English (US)",
series = "2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "748--751",
booktitle = "2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014",
address = "United States",
}