Prediction of interface dielectric relaxations in bimodal brush functionalized epoxy nanodielectrics by finite element analysis method

Yanhui Huang, Timothy M. Krentz, J. Keith Nelson, Linda S. Schadler, Yang Li, He Zhao, L. Catherine Brinson, Michael Bell, Brian Benicewicz, Ke Wu, Curt M. Breneman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Fingerprint

Dive into the research topics of 'Prediction of interface dielectric relaxations in bimodal brush functionalized epoxy nanodielectrics by finite element analysis method'. Together they form a unique fingerprint.

Keyphrases

Material Science