Preparation and x-ray diffraction studies of compositionally modulated PbTe/Bi films

Sung C. Shin*, J. E. Hilliard, J. B. Ketterson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

A technique is described for preparing compositionally modulated PbTe/Bi films on mica with a well-defined [111] epitaxy by evaporation. For short wavelengths or a large ratio of PbTe to bismuth, the bismuth layers of the film approached a quasi-simple-cubic structure.

Original languageEnglish (US)
Pages (from-to)323-330
Number of pages8
JournalThin Solid Films
Volume111
Issue number4
DOIs
StatePublished - Jan 27 1984

Funding

We wish to thank D, Baral for his help in installingt he vacuums ystemT. his work was supported by The Office of Naval Research under Grant NOOO14-82-K-529a8n d theN orthwesternM aterialsR esearchC enteru nder Grant DMR79-23573.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Preparation and x-ray diffraction studies of compositionally modulated PbTe/Bi films'. Together they form a unique fingerprint.

Cite this