Pressure measurement technique in nano- and micro-channels using atomic force microscopy

Sun K. Kim; Isaac M. Daniel

doi:10.1080/17415970600557273

Pressure measurement technique in nano- and micro-channels using atomic force microscopy

Sun K. Kim^*, Isaac M. Daniel

^*Corresponding author for this work

Civil and Environmental Engineering

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

This article presents a method for measuring pressure profiles in nano- or micro-channels from topographic imaging of thin channel surfaces using atomic force microscopy. The pressure distribution is calculated from the measured conduit deformation by solving an inverse problem. The related computational model and inverse formalism are proposed.

Original language	English (US)
Pages (from-to)	701-709
Number of pages	9
Journal	Inverse Problems in Science and Engineering
Volume	14
Issue number	7
DOIs	https://doi.org/10.1080/17415970600557273
State	Published - Oct 1 2006

Keywords

Atomic force microscopy
Micro-channel flow
Pressure measurement

ASJC Scopus subject areas

Engineering(all)
Computer Science Applications
Applied Mathematics

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10.1080/17415970600557273

Cite this

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title = "Pressure measurement technique in nano- and micro-channels using atomic force microscopy",

abstract = "This article presents a method for measuring pressure profiles in nano- or micro-channels from topographic imaging of thin channel surfaces using atomic force microscopy. The pressure distribution is calculated from the measured conduit deformation by solving an inverse problem. The related computational model and inverse formalism are proposed.",

keywords = "Atomic force microscopy, Micro-channel flow, Pressure measurement",

author = "Kim, {Sun K.} and Daniel, {Isaac M.}",

note = "Funding Information: This work was supported by a Korea Research Foundation Grant (KRF-2005-003-D0039).",

year = "2006",

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doi = "10.1080/17415970600557273",

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AU - Kim, Sun K.

AU - Daniel, Isaac M.

N1 - Funding Information: This work was supported by a Korea Research Foundation Grant (KRF-2005-003-D0039).

PY - 2006/10/1

Y1 - 2006/10/1

N2 - This article presents a method for measuring pressure profiles in nano- or micro-channels from topographic imaging of thin channel surfaces using atomic force microscopy. The pressure distribution is calculated from the measured conduit deformation by solving an inverse problem. The related computational model and inverse formalism are proposed.

AB - This article presents a method for measuring pressure profiles in nano- or micro-channels from topographic imaging of thin channel surfaces using atomic force microscopy. The pressure distribution is calculated from the measured conduit deformation by solving an inverse problem. The related computational model and inverse formalism are proposed.

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KW - Micro-channel flow

KW - Pressure measurement

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Pressure measurement technique in nano- and micro-channels using atomic force microscopy

Abstract

Keywords

ASJC Scopus subject areas

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