Pressure measurement technique in nano- and micro-channels using atomic force microscopy

Sun K. Kim*, Isaac M. Daniel

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

This article presents a method for measuring pressure profiles in nano- or micro-channels from topographic imaging of thin channel surfaces using atomic force microscopy. The pressure distribution is calculated from the measured conduit deformation by solving an inverse problem. The related computational model and inverse formalism are proposed.

Original languageEnglish (US)
Pages (from-to)701-709
Number of pages9
JournalInverse Problems in Science and Engineering
Volume14
Issue number7
DOIs
StatePublished - Oct 1 2006

Keywords

  • Atomic force microscopy
  • Micro-channel flow
  • Pressure measurement

ASJC Scopus subject areas

  • Engineering(all)
  • Computer Science Applications
  • Applied Mathematics

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