Abstract
This article presents a method for measuring pressure profiles in nano- or micro-channels from topographic imaging of thin channel surfaces using atomic force microscopy. The pressure distribution is calculated from the measured conduit deformation by solving an inverse problem. The related computational model and inverse formalism are proposed.
Original language | English (US) |
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Pages (from-to) | 701-709 |
Number of pages | 9 |
Journal | Inverse Problems in Science and Engineering |
Volume | 14 |
Issue number | 7 |
DOIs | |
State | Published - Oct 1 2006 |
Keywords
- Atomic force microscopy
- Micro-channel flow
- Pressure measurement
ASJC Scopus subject areas
- Engineering(all)
- Computer Science Applications
- Applied Mathematics