Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Nathan L. Yoder*, Mark Hersam

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
Original languageEnglish (US)
Title of host publication3rd Conference on Foundations of Nanoscience
Subtitle of host publicationSelf-Assembled Architectures and Devices, FNANO 2006
Pages80-82
Number of pages3
StatePublished - Dec 1 2006
Event3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006 - Snowbird, UT, United States
Duration: Apr 23 2006Apr 27 2006

Other

Other3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006
CountryUnited States
CitySnowbird, UT
Period4/23/064/27/06

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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