Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Nathan L. Yoder; Mark Hersam

Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Nathan L. Yoder^*, Mark Hersam

^*Corresponding author for this work

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	3rd Conference on Foundations of Nanoscience
Subtitle of host publication	Self-Assembled Architectures and Devices, FNANO 2006
Pages	80-82
Number of pages	3
State	Published - Dec 1 2006
Event	3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006 - Snowbird, UT, United States Duration: Apr 23 2006 → Apr 27 2006

Other

Other	3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006
Country/Territory	United States
City	Snowbird, UT
Period	4/23/06 → 4/27/06

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering

Cite this

@inproceedings{d76476449a074912a3bced4de04500d6,

title = "Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy",

author = "Yoder, {Nathan L.} and Mark Hersam",

year = "2006",

month = dec,

day = "1",

language = "English (US)",

pages = "80--82",

booktitle = "3rd Conference on Foundations of Nanoscience",

note = "3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006 ; Conference date: 23-04-2006 Through 27-04-2006",

}

Yoder, NL & Hersam, M 2006, Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. in 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006. pp. 80-82, 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006, Snowbird, UT, United States, 4/23/06.

Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. / Yoder, Nathan L.; Hersam, Mark.
3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006. 2006. p. 80-82.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

AU - Yoder, Nathan L.

AU - Hersam, Mark

PY - 2006/12/1

Y1 - 2006/12/1

UR - http://www.scopus.com/inward/record.url?scp=84874738292&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84874738292&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84874738292

SP - 80

EP - 82

BT - 3rd Conference on Foundations of Nanoscience

T2 - 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006

Y2 - 23 April 2006 through 27 April 2006

ER -

Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Other

ASJC Scopus subject areas

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Cite this