Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Nathan L. Yoder; Mark C. Hersam

Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Nathan L. Yoder^*, Mark C. Hersam

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

Original language	English (US)
Pages	80-82
Number of pages	3
State	Published - 2006
Event	3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006 - Snowbird, UT, United States Duration: Apr 23 2006 → Apr 27 2006

Other

Other	3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006
Country/Territory	United States
City	Snowbird, UT
Period	4/23/06 → 4/27/06

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering

Cite this

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title = "Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy",

author = "Yoder, {Nathan L.} and Hersam, {Mark C.}",

year = "2006",

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pages = "80--82",

note = "3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006 ; Conference date: 23-04-2006 Through 27-04-2006",

}

Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy. / Yoder, Nathan L.; Hersam, Mark C.
2006. 80-82 Paper presented at 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006, Snowbird, UT, United States.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

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AU - Hersam, Mark C.

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M3 - Paper

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T2 - 3rd Conference on Foundations of Nanoscience: Self-Assembled Architectures and Devices, FNANO 2006

Y2 - 23 April 2006 through 27 April 2006

ER -

Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy

Other

ASJC Scopus subject areas

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Cite this