Problems with the use of surface reconstructions as indicators of a well-ordered surface

D. N. Dunn*, P. Xu, L. D. Marks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The presence of sharp surface reconstruction or diffraction spots is often taken as an indicator of a well-ordered surface. We present results obtained using transmission electron microscopy in ultra-high vacuum (UHV) which demonstrate that even if the surface is well-ordered and reconstructed, there may be very high defect concentrations just below the surface of the order of 1011-1013 cm-2. The key point is that surface ordering takes place via surface diffusion, but the temperature where this is active are too low to anneal out the near-surface defects through bulk diffusion.

Original languageEnglish (US)
Pages (from-to)543-547
Number of pages5
JournalJournal of Crystal Growth
Volume125
Issue number3-4
DOIs
StatePublished - Dec 1992

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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