Production and metrology of 5 μm x-ray apertures for 100 keV diffraction studies in the diamond anvil cell

Arthur L. Ruoff*, Huan Luo, Craig Vanderborgh, Hui Xia, Keith Brister, Volker Arnold

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    14 Scopus citations

    Abstract

    Microminiaturization of the diamond anvil tip is necessary in order to obtain multimegabar pressures. Because of this and the steep pressure gradients present tiny x-ray beams are required. This paper describes the production and metrology of 5 μm x-ray apertures for x-ray diffraction studies to 100 keV in the diamond anvil cell. It is expected that this design will serve as the basis for 2 μm apertures.

    Original languageEnglish (US)
    Pages (from-to)3462-3466
    Number of pages5
    JournalReview of Scientific Instruments
    Volume64
    Issue number12
    DOIs
    StatePublished - 1993

    ASJC Scopus subject areas

    • Instrumentation

    Fingerprint Dive into the research topics of 'Production and metrology of 5 μm x-ray apertures for 100 keV diffraction studies in the diamond anvil cell'. Together they form a unique fingerprint.

    Cite this