Abstract
Previously we have reported on our work on coating a truncated-cone-shaped "engineering" (not high quality in terms of smoothness) mandrel and have removed the layers, intact, on the inside of an electroform with a cylindrical, truncated-cone geometry. We have advanced to using a high quality (about 0.5 nm) smooth truncated cone. We report our latest advances in refining our fabrication techniques and the results of X-ray measurements. The X-ray measurements made at the Argonne APS SRI-CAT 2-BM-B beam-line were at 10 and 30 keV. The results showed that we had produced excellent Si/W multilayers on the inside of a 10 cm long by about 10 cm diameter truncated cone shaped mirror. We estimate the reflectivity of the layers at the primary Bragg peak to be well above 10%. We also show that the multilayers were uniform around the mirror.
Original language | English (US) |
---|---|
Pages (from-to) | 127-133 |
Number of pages | 7 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4496 |
DOIs | |
State | Published - Jan 1 2002 |
Keywords
- Electroforming
- Multilayers
- X-ray optics
- X-ray reflectivity
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering