Propagation loss measurements in semiconductor microcavity ring and disk resonators

D. Rafizadeh*, J. P. Zhang, R. C. Tiberio, S. T. Ho

*Corresponding author for this work

Research output: Contribution to journalArticle

64 Scopus citations

Abstract

We report the measurement of cavity propagation losses in nearly single-mode semiconductor waveguide-coupled ring and disk microcavity optical resonators. Using a novel 10.5-μm-diameter ring resonator, we measure transverse electric (TE) and transverse magnetic (TM) field intensity losses in 0.35-μm-wide ring waveguide cavities in the 1.55-μm-wavelength region. We present the experimental results for nanofabricated AlGaAs/GaAs 10.5-μm-diameter ring and disk resonators to quantify cavity losses and to show the feasibility of these promising and robust submicron-scale devices.

Original languageEnglish (US)
Pages (from-to)1308-1313
Number of pages6
JournalJournal of Lightwave Technology
Volume16
Issue number7
DOIs
StatePublished - Jul 1 1998

Keywords

  • Integrated optics
  • Loss measurement
  • Microresonators
  • Optical device fabrication
  • Optical filters
  • Optical waveguides

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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