Proton radiation hardness of single-nanowire transistors using robust organic gate nanodielectrics

Sanghyun Ju, Kangho Lee, David B. Janes*, Ramesh C. Dwivedi, Habibah Baffour-Awuah, R. Wilkins, Myung Han Yoon, Antonio Facchetti, Tobin J. Mark

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Physics & Astronomy