Pulsed laser deposition of Cu:Al2O3 nanocrystal thin films with high third-order optical susceptibility

J. M. Ballesteros*, R. Serna, J. Solís, C. N. Afonso, A. K. Petford-Long, D. H. Osborne, R. F. Haglund

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

129 Scopus citations

Abstract

Nanocomposite films comprising metal Cu nanocrystals embedded in an Al2O3 matrix were deposited by alternating pulsed laser ablation from metallic Cu and ceramic Al2O3 targets. The films were grown in vacuum on glass substrates held at room temperature. The as-grown films contain 4 nm Cu nanocrystals in an amorphous Al2O3 matrix, with a total thickness of 190 nm. The films show a substantial third-order susceptibility with an electronic nonlinear refractive index of (2.93 ± 1.08) · 10-10 cm2 W-1 and a nonlinear saturation of -(2.34±0.18) · 10-5 cm W-1.

Original languageEnglish (US)
Pages (from-to)2445-2447
Number of pages3
JournalApplied Physics Letters
Volume71
Issue number17
DOIs
StatePublished - Oct 27 1997

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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