Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy

G. H. Vander Rhodes; J. M. Pomeroy; M. S. Ünlü; B. B. Goldberg; K. J. Knopp; D. H. Christensen

doi:10.1063/1.121192

Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy

G. H. Vander Rhodes^*, J. M. Pomeroy, M. S. Ünlü, B. B. Goldberg, K. J. Knopp, D. H. Christensen

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

We have mapped the internal pump intensity distribution of an optically pumped vertical-cavity surface-emitting laser. Spontaneous emission from quantum wells placed throughout the distributed Bragg reflectors is correlated to the pump intensity. The emission is monitored along the cleaved edge using the high spatial resolution and shallow depth of field provided by near-field scanning optical microscopy. Our results show a distinct buildup of optical intensity between the mirror stacks. Simulations performed using the transfer matrix method match well with the experimental data.

Original language	English (US)
Pages (from-to)	1811-1813
Number of pages	3
Journal	Applied Physics Letters
Volume	72
Issue number	15
DOIs	https://doi.org/10.1063/1.121192
State	Published - 1998

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.121192

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title = "Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy",

abstract = "We have mapped the internal pump intensity distribution of an optically pumped vertical-cavity surface-emitting laser. Spontaneous emission from quantum wells placed throughout the distributed Bragg reflectors is correlated to the pump intensity. The emission is monitored along the cleaved edge using the high spatial resolution and shallow depth of field provided by near-field scanning optical microscopy. Our results show a distinct buildup of optical intensity between the mirror stacks. Simulations performed using the transfer matrix method match well with the experimental data.",

author = "{Vander Rhodes}, {G. H.} and Pomeroy, {J. M.} and {\"U}nl{\"u}, {M. S.} and Goldberg, {B. B.} and Knopp, {K. J.} and Christensen, {D. H.}",

year = "1998",

doi = "10.1063/1.121192",

language = "English (US)",

volume = "72",

pages = "1811--1813",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

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T1 - Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy

AU - Vander Rhodes, G. H.

AU - Pomeroy, J. M.

AU - Ünlü, M. S.

AU - Goldberg, B. B.

AU - Knopp, K. J.

AU - Christensen, D. H.

PY - 1998

Y1 - 1998

N2 - We have mapped the internal pump intensity distribution of an optically pumped vertical-cavity surface-emitting laser. Spontaneous emission from quantum wells placed throughout the distributed Bragg reflectors is correlated to the pump intensity. The emission is monitored along the cleaved edge using the high spatial resolution and shallow depth of field provided by near-field scanning optical microscopy. Our results show a distinct buildup of optical intensity between the mirror stacks. Simulations performed using the transfer matrix method match well with the experimental data.

AB - We have mapped the internal pump intensity distribution of an optically pumped vertical-cavity surface-emitting laser. Spontaneous emission from quantum wells placed throughout the distributed Bragg reflectors is correlated to the pump intensity. The emission is monitored along the cleaved edge using the high spatial resolution and shallow depth of field provided by near-field scanning optical microscopy. Our results show a distinct buildup of optical intensity between the mirror stacks. Simulations performed using the transfer matrix method match well with the experimental data.

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U2 - 10.1063/1.121192

DO - 10.1063/1.121192

M3 - Article

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VL - 72

SP - 1811

EP - 1813

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 15

ER -

Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy

Abstract

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