Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Anton V. Naumov; Oleg A. Kuznetsov; Avetik R. Harutyunyan; Alexander A. Green; Mark C. Hersam; Daniel E. Resasco; Pavel N. Nikolaev; R. Bruce Weisman

doi:10.1021/nl9014342

Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Anton V. Naumov, Oleg A. Kuznetsov, Avetik R. Harutyunyan, Alexander A. Green, Mark C. Hersam, Daniel E. Resasco, Pavel N. Nikolaev, R. Bruce Weisman

Research output: Contribution to journal › Article › peer-review

61 Scopus citations

Abstract

A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.

Original language	English (US)
Pages (from-to)	3203-3208
Number of pages	6
Journal	Nano letters
Volume	9
Issue number	9
DOIs	https://doi.org/10.1021/nl9014342
State	Published - Sep 9 2009
Externally published	Yes

ASJC Scopus subject areas

Condensed Matter Physics
Mechanical Engineering
Bioengineering
General Chemistry
General Materials Science

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10.1021/nl9014342

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title = "Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies",

abstract = "A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.",

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AU - Kuznetsov, Oleg A.

AU - Harutyunyan, Avetik R.

AU - Green, Alexander A.

AU - Hersam, Mark C.

AU - Resasco, Daniel E.

AU - Nikolaev, Pavel N.

AU - Weisman, R. Bruce

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AB - A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.

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Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Abstract

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