Quantitative measurements of the thermal resistance of Andreev interferometers

Z. Jiang*, V. Chandrasekhar

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

Using a local thermometry technique, we have been able to quantitatively measure the thermal resistance RT of diffusive Andreev interferometers. We find that RT is strongly enhanced from its normal-state value at low temperatures, and behaves nonlinearly as a function of the thermal current through the sample. We also find that RT oscillates as a function of magnetic flux with a fundamental period corresponding to one flux quantum Φ0=h 2e, demonstrating the phase-coherent nature of thermal transport in these devices. The magnitude of RT is larger than predicted by recent numerical simulations.

Original languageEnglish (US)
Article number020502
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume72
Issue number2
DOIs
StatePublished - Jul 1 2005

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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