Quantitative mobility spectrum analysis (QMSA) for Hall characterization of electrons and holes in anisotropic bands

I. Vurgaftman*, J. R. Meyer, C. A. Hoffman, S. Cho, J. B. Ketterson, L. Faraone, J. Antoszewski, J. R. Lindemuth

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

An extension of the quantitative mobility spectrum analysis (QMSA) procedure, which determines free electron and hole densities and mobilities from magnetic-field-dependent Hall and resistivity measurements, to materials exhibiting anisotropic conduction is presented. As test cases, the fully computer-automated procedure is used to analyze magnetotransport data from Bi thin films and Bi/CdTe superlattices. Using the results of the QMSA procedure, the thermoelectric properties of these films can be accurately modeled. As a second example, an electron mobility anisotropy ratio of ≈ 4.5 is derived from the QMSA treatment of the Hall data for bulk Si samples.

Original languageEnglish (US)
Pages (from-to)548-552
Number of pages5
JournalJournal of Electronic Materials
Volume28
Issue number5
DOIs
StatePublished - May 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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