Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy

Huajun Liu, Yongqi Dong, Mathew J. Cherukara, Kiran Sasikumar, Badri Narayanan, Zhonghou Cai, Barry Lai, Liliana Stan, Seungbum Hong, Maria K.Y. Chan, Subramanian K.R.S. Sankaranarayanan, Hua Zhou^*, DIllon D. Fong