Quantum Sensing of a Microwire’s Temperature

H. Ather, H. An, H. Owens, S. Alajlouni, A. Shakouri, M. Hosseini*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Using a four-wave mixing source of intensity-squeezed light, we perform thermoreflectivity measurement of a wire to determine the wire’s temperature with sub-shot-noise precision.

Original languageEnglish (US)
Title of host publicationQuantum Sensing, Imaging, and Precision Metrology
EditorsJacob Scheuer, Selim M. Shahriar
PublisherSPIE
ISBN (Electronic)9781510659995
DOIs
StatePublished - 2023
EventQuantum Sensing, Imaging, and Precision Metrology 2023 - San Francisco, United States
Duration: Jan 28 2023Feb 2 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12447
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceQuantum Sensing, Imaging, and Precision Metrology 2023
Country/TerritoryUnited States
CitySan Francisco
Period1/28/232/2/23

Keywords

  • Intensity squeezing
  • four-wave mixing
  • thermoreflectivity

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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