Abstract
Results of detector characterization are presented for quantum well infrared photodetectors (QWIPs) fabricated from a variety of III-V material systems lattice-matched to InP substrate. Extremely large responsivities of 33.2 A/W were obtained from GaInAs/InP QWIPs operating at λ = 9 μm which represents to the authors' knowledge the largest value of responsivity for any QWIP in this wavelength range. Devices made from AlGaInAs/InP and GaInAs/AlInAs have also been realized that extend the wavelength range of sensitivity from 3 μm out to 20 μm while remaining lattice-matched to InP. Lattice-matched multispectral detectors are demonstrated for sensitivity at both 4 μm and 8.5 μm. Localized epitaxy of GaInAs/InP superlattice structures lattice-matched to InP was performed on Si substrate for the purpose of monolithic integration of III-V QWIPs with Si-based read-out integrated circuitry.
Original language | English (US) |
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Pages (from-to) | 335-347 |
Number of pages | 13 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4130 |
DOIs | |
State | Published - 2000 |
Keywords
- AlGaInAs
- GaInAsP
- InP
- Monolithic integration
- Quantum well infrared photodetector
- Si
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering