TY - JOUR
T1 - Radiometric characterization of long-wavelength infrared type II strained layer superlattice focal plane array under low-photon irradiance conditions
AU - Hubbs, John E.
AU - Nathan, Vaidya
AU - Tidrow, Meimei
AU - Razeghi, Manijeh
PY - 2012/6
Y1 - 2012/6
N2 - We present the results of the radiometric characterization of an "M" structure long wavelength infrared Type-II strained layer superlattice (SLS) infrared focal plane array (IRFPA) developed by Northwestern University (NWU). The performance of the M-structure SLS IRFPA was radiometrically characterized as a function of photon irradiance, integration time, operating temperature, and detector bias. Its performance is described using standard figures of merit: responsivity, noise, and noise equivalent irradiance. Assuming background limited performance operation at higher irradiances, the detector quantum efficiency for the SLS detector array is approximately 57%. The detector dark density at 80 K is 142 μA/cm 2, which represents a factor of seven reduction from previously measured devices.
AB - We present the results of the radiometric characterization of an "M" structure long wavelength infrared Type-II strained layer superlattice (SLS) infrared focal plane array (IRFPA) developed by Northwestern University (NWU). The performance of the M-structure SLS IRFPA was radiometrically characterized as a function of photon irradiance, integration time, operating temperature, and detector bias. Its performance is described using standard figures of merit: responsivity, noise, and noise equivalent irradiance. Assuming background limited performance operation at higher irradiances, the detector quantum efficiency for the SLS detector array is approximately 57%. The detector dark density at 80 K is 142 μA/cm 2, which represents a factor of seven reduction from previously measured devices.
KW - Infrared detectors
KW - Infrared focal plane array
KW - Low photon irradiance
KW - Strained layer superlattice detectors
UR - http://www.scopus.com/inward/record.url?scp=84891780592&partnerID=8YFLogxK
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U2 - 10.1117/1.OE.51.6.064002
DO - 10.1117/1.OE.51.6.064002
M3 - Article
AN - SCOPUS:84891780592
SN - 0091-3286
VL - 51
JO - Optical Engineering
JF - Optical Engineering
IS - 6
M1 - 064002
ER -