Raman concentrators in Ge nanowires with dielectric coatings

Jerome K. Hyun*, In Soo Kim, Justin G. Connell, Lincoln J. Lauhon

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Raman spectroscopy is a powerful tool for investigating many fundamental properties of nanostructures, but extrinsic effects including background scattering and laser-induced heating can limit the analysis of intrinsic properties. A thin SiO2 dielectric coating is found to enhance the Raman signal from a single Ge nanowire by a factor of two as a result of wave interference. Consequently, the coated nanowire experiences less heating than a bare nanowire at equivalent signal intensities. The results demonstrate a simple and effective method to extend the limits of Raman analysis on single nanostructures and facilitate their characterization.

Original languageEnglish (US)
Pages (from-to)5127-5132
Number of pages6
JournalOptics Express
Volume20
Issue number5
DOIs
StatePublished - Feb 27 2012

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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