Raman spectroscopy as a probe of single semiconductor nanowires

A. Abdi; L. V. Titova; L. M. Smith; H. E. Jackson; J. M. Yarrison-Rice; J. L. Lensch; L. J. Lauhon

doi:10.1109/nano.2006.247588

Raman spectroscopy as a probe of single semiconductor nanowires

A. Abdi^*, L. V. Titova, L. M. Smith, H. E. Jackson, J. M. Yarrison-Rice, J. L. Lensch, L. J. Lauhon

^*Corresponding author for this work

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report on room temperature resonant Raman scattering measurements on individual CdS nanowires. We show that spatially-resolved Raman spectroscopy on single nanowires can be used as a tool to study structural and compositional uniformity of the nanowire.

Original language	English (US)
Title of host publication	2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	137-139
Number of pages	3
ISBN (Print)	1424400783, 9781424400782
DOIs	https://doi.org/10.1109/nano.2006.247588
State	Published - 2006
Event	2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 - Cincinnati, OH, United States Duration: Jun 17 2006 → Jun 20 2006

Publication series

Name	2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Volume	1

Other

Other	2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Country/Territory	United States
City	Cincinnati, OH
Period	6/17/06 → 6/20/06

Keywords

CdS
Longitudinal opticalphonon (LO)
Nanowires
Resonant Raman scattering (RRS)

ASJC Scopus subject areas

Electrical and Electronic Engineering
General Materials Science

Access to Document

10.1109/nano.2006.247588

Cite this

Abdi, A., Titova, L. V., Smith, L. M., Jackson, H. E., Yarrison-Rice, J. M., Lensch, J. L., & Lauhon, L. J. (2006). Raman spectroscopy as a probe of single semiconductor nanowires. In 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 (pp. 137-139). Article 1717038 (2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/nano.2006.247588

@inproceedings{6fa033e54d054c59979fa506e311744c,

title = "Raman spectroscopy as a probe of single semiconductor nanowires",

abstract = "We report on room temperature resonant Raman scattering measurements on individual CdS nanowires. We show that spatially-resolved Raman spectroscopy on single nanowires can be used as a tool to study structural and compositional uniformity of the nanowire.",

keywords = "CdS, Longitudinal opticalphonon (LO), Nanowires, Resonant Raman scattering (RRS)",

author = "A. Abdi and Titova, {L. V.} and Smith, {L. M.} and Jackson, {H. E.} and Yarrison-Rice, {J. M.} and Lensch, {J. L.} and Lauhon, {L. J.}",

year = "2006",

doi = "10.1109/nano.2006.247588",

language = "English (US)",

isbn = "1424400783",

series = "2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "137--139",

booktitle = "2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006",

address = "United States",

note = "2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 ; Conference date: 17-06-2006 Through 20-06-2006",

}

Abdi, A, Titova, LV, Smith, LM, Jackson, HE, Yarrison-Rice, JM, Lensch, JL & Lauhon, LJ 2006, Raman spectroscopy as a probe of single semiconductor nanowires. in 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006., 1717038, 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006, vol. 1, Institute of Electrical and Electronics Engineers Inc., pp. 137-139, 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006, Cincinnati, OH, United States, 6/17/06. https://doi.org/10.1109/nano.2006.247588

Raman spectroscopy as a probe of single semiconductor nanowires. / Abdi, A.; Titova, L. V.; Smith, L. M. et al.
2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006. Institute of Electrical and Electronics Engineers Inc., 2006. p. 137-139 1717038 (2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Raman spectroscopy as a probe of single semiconductor nanowires

AU - Abdi, A.

AU - Titova, L. V.

AU - Smith, L. M.

AU - Jackson, H. E.

AU - Yarrison-Rice, J. M.

AU - Lensch, J. L.

AU - Lauhon, L. J.

PY - 2006

Y1 - 2006

N2 - We report on room temperature resonant Raman scattering measurements on individual CdS nanowires. We show that spatially-resolved Raman spectroscopy on single nanowires can be used as a tool to study structural and compositional uniformity of the nanowire.

AB - We report on room temperature resonant Raman scattering measurements on individual CdS nanowires. We show that spatially-resolved Raman spectroscopy on single nanowires can be used as a tool to study structural and compositional uniformity of the nanowire.

KW - CdS

KW - Longitudinal opticalphonon (LO)

KW - Nanowires

KW - Resonant Raman scattering (RRS)

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U2 - 10.1109/nano.2006.247588

DO - 10.1109/nano.2006.247588

M3 - Conference contribution

AN - SCOPUS:42549159513

SN - 1424400783

SN - 9781424400782

T3 - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006

SP - 137

EP - 139

BT - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006

Y2 - 17 June 2006 through 20 June 2006

ER -

Abdi A, Titova LV, Smith LM, Jackson HE, Yarrison-Rice JM, Lensch JL et al. Raman spectroscopy as a probe of single semiconductor nanowires. In 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006. Institute of Electrical and Electronics Engineers Inc. 2006. p. 137-139. 1717038. (2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006). doi: 10.1109/nano.2006.247588

Raman spectroscopy as a probe of single semiconductor nanowires

Abstract

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Keywords

ASJC Scopus subject areas

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