Raman spectroscopy as a probe of single semiconductor nanowires

A. Abdi*, L. V. Titova, L. M. Smith, H. E. Jackson, J. M. Yarrison-Rice, J. L. Lensch, L. J. Lauhon

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report on room temperature resonant Raman scattering measurements on individual CdS nanowires. We show that spatially-resolved Raman spectroscopy on single nanowires can be used as a tool to study structural and compositional uniformity of the nanowire.

Original languageEnglish (US)
Title of host publication2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages137-139
Number of pages3
ISBN (Print)1424400783, 9781424400782
DOIs
StatePublished - Jan 1 2006
Event2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 - Cincinnati, OH, United States
Duration: Jun 17 2006Jun 20 2006

Publication series

Name2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Volume1

Other

Other2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
CountryUnited States
CityCincinnati, OH
Period6/17/066/20/06

Keywords

  • CdS
  • Longitudinal opticalphonon (LO)
  • Nanowires
  • Resonant Raman scattering (RRS)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)

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