Abstract
A low-energy electron diffraction instrument has been constructed which allows one to visually observe a LEED pattern, record the pattern photographically and obtain immediate, quantitative intensity data from several diffraction beams in 5-10 s. The instrument operates at incident beam currents of a few picoamperes eliminating electron beam damage effects. This paper describes the design and construction of this new LEED instrument and reports on the operating parameters of sensitivity, signal-to-noise, image distortion, and angular resolution.
Original language | English (US) |
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Pages (from-to) | 132-135 |
Number of pages | 4 |
Journal | Review of Scientific Instruments |
Volume | 51 |
Issue number | 1 |
DOIs | |
State | Published - 1980 |
ASJC Scopus subject areas
- Instrumentation