Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy

J. Ciston*, S. J. Haigh, J. S. Kim, A. I. Kirkland, L. D. Marks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1478-1479
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009

ASJC Scopus subject areas

  • Instrumentation

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