Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy

J. Ciston; S. J. Haigh; J. S. Kim; A. I. Kirkland; L. D. Marks

doi:10.1017/S1431927609094719

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy

J. Ciston^*, S. J. Haigh, J. S. Kim, A. I. Kirkland, L. D. Marks

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1478-1479
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609094719
State	Published - Jul 2009

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927609094719

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@article{0a68faae730841558400462ee27069b8,

title = "Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy",

author = "J. Ciston and Haigh, {S. J.} and Kim, {J. S.} and Kirkland, {A. I.} and Marks, {L. D.}",

year = "2009",

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doi = "10.1017/S1431927609094719",

language = "English (US)",

volume = "15",

pages = "1478--1479",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

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TY - JOUR

T1 - Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy

AU - Ciston, J.

AU - Haigh, S. J.

AU - Kim, J. S.

AU - Kirkland, A. I.

AU - Marks, L. D.

PY - 2009/7

Y1 - 2009/7

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U2 - 10.1017/S1431927609094719

DO - 10.1017/S1431927609094719

M3 - Article

AN - SCOPUS:69949147261

SN - 1431-9276

VL - 15

SP - 1478

EP - 1479

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy

ASJC Scopus subject areas

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