TY - JOUR
T1 - Recent advances and applications of deep learning methods in materials science
AU - Choudhary, Kamal
AU - DeCost, Brian
AU - Chen, Chi
AU - Jain, Anubhav
AU - Tavazza, Francesca
AU - Cohn, Ryan
AU - Park, Cheol Woo
AU - Choudhary, Alok
AU - Agrawal, Ankit
AU - Billinge, Simon J.L.
AU - Holm, Elizabeth
AU - Ong, Shyue Ping
AU - Wolverton, Chris
N1 - Funding Information:
Contributions from K.C. were supported by the financial assistance award 70NANB19H117 from the U.S. Department of Commerce, National Institute of Standards and Technology. E.A.H. and R.C. (CMU) were supported by the National Science Foundation under grant CMMI-1826218 and the Air Force D3OM2S Center of Excellence under agreement FA8650-19-2-5209. A.J., C.C., and S.P.O. were supported by the Materials Project, funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division under contract no. DE-AC02-05-CH11231: Materials Project program KC23MP. S.J.L.B. was supported by the U.S. National Science Foundation through grant DMREF-1922234. A.A. and A.C. were supported by NIST award 70NANB19H005 and NSF award CMMI-2053929.
Publisher Copyright:
© 2022, This is a U.S. government work and not under copyright protection in the U.S.; foreign copyright protection may apply.
PY - 2022/12
Y1 - 2022/12
N2 - Deep learning (DL) is one of the fastest-growing topics in materials data science, with rapidly emerging applications spanning atomistic, image-based, spectral, and textual data modalities. DL allows analysis of unstructured data and automated identification of features. The recent development of large materials databases has fueled the application of DL methods in atomistic prediction in particular. In contrast, advances in image and spectral data have largely leveraged synthetic data enabled by high-quality forward models as well as by generative unsupervised DL methods. In this article, we present a high-level overview of deep learning methods followed by a detailed discussion of recent developments of deep learning in atomistic simulation, materials imaging, spectral analysis, and natural language processing. For each modality we discuss applications involving both theoretical and experimental data, typical modeling approaches with their strengths and limitations, and relevant publicly available software and datasets. We conclude the review with a discussion of recent cross-cutting work related to uncertainty quantification in this field and a brief perspective on limitations, challenges, and potential growth areas for DL methods in materials science.
AB - Deep learning (DL) is one of the fastest-growing topics in materials data science, with rapidly emerging applications spanning atomistic, image-based, spectral, and textual data modalities. DL allows analysis of unstructured data and automated identification of features. The recent development of large materials databases has fueled the application of DL methods in atomistic prediction in particular. In contrast, advances in image and spectral data have largely leveraged synthetic data enabled by high-quality forward models as well as by generative unsupervised DL methods. In this article, we present a high-level overview of deep learning methods followed by a detailed discussion of recent developments of deep learning in atomistic simulation, materials imaging, spectral analysis, and natural language processing. For each modality we discuss applications involving both theoretical and experimental data, typical modeling approaches with their strengths and limitations, and relevant publicly available software and datasets. We conclude the review with a discussion of recent cross-cutting work related to uncertainty quantification in this field and a brief perspective on limitations, challenges, and potential growth areas for DL methods in materials science.
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U2 - 10.1038/s41524-022-00734-6
DO - 10.1038/s41524-022-00734-6
M3 - Review article
AN - SCOPUS:85127831192
VL - 8
JO - npj Computational Materials
JF - npj Computational Materials
SN - 2057-3960
IS - 1
M1 - 59
ER -