Record charge carrier diffusion length in colloidal quantum dot solids via mutual dot-to-dot surface passivation

Graham H. Carey; Larissa Levina; Riccardo Comin; Oleksandr Voznyy; Edward H. Sargent

doi:10.1002/adma.201405782

Record charge carrier diffusion length in colloidal quantum dot solids via mutual dot-to-dot surface passivation

Graham H. Carey, Larissa Levina, Riccardo Comin, Oleksandr Voznyy, Edward H. Sargent^*

^*Corresponding author for this work

Chemistry

Research output: Contribution to journal › Article › peer-review

127 Scopus citations

Abstract

Through a combination of chemical and mutual dot-to-dot surface passivation, high-quality colloidal quantum dot solids are fabricated. The joint passivation techniques lead to a record diffusion length for colloidal quantum dots of 230 ± 20 nm. The technique is applied to create thick photovoltaic devices that exhibit high current density without losing fill factor.

Original language	English (US)
Pages (from-to)	3325-3330
Number of pages	6
Journal	Advanced Materials
Volume	27
Issue number	21
DOIs	https://doi.org/10.1002/adma.201405782
State	Published - Jun 1 2015

Keywords

colloidal quantum dots
diffusion length
surface passivation
surface-to-volume ratio

ASJC Scopus subject areas

Mechanics of Materials
Mechanical Engineering
General Materials Science

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1002/adma.201405782

Cite this

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abstract = "Through a combination of chemical and mutual dot-to-dot surface passivation, high-quality colloidal quantum dot solids are fabricated. The joint passivation techniques lead to a record diffusion length for colloidal quantum dots of 230 ± 20 nm. The technique is applied to create thick photovoltaic devices that exhibit high current density without losing fill factor.",

keywords = "colloidal quantum dots, diffusion length, surface passivation, surface-to-volume ratio",

author = "Carey, {Graham H.} and Larissa Levina and Riccardo Comin and Oleksandr Voznyy and Sargent, {Edward H.}",

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doi = "10.1002/adma.201405782",

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T1 - Record charge carrier diffusion length in colloidal quantum dot solids via mutual dot-to-dot surface passivation

AU - Carey, Graham H.

AU - Levina, Larissa

AU - Comin, Riccardo

AU - Voznyy, Oleksandr

AU - Sargent, Edward H.

PY - 2015/6/1

Y1 - 2015/6/1

N2 - Through a combination of chemical and mutual dot-to-dot surface passivation, high-quality colloidal quantum dot solids are fabricated. The joint passivation techniques lead to a record diffusion length for colloidal quantum dots of 230 ± 20 nm. The technique is applied to create thick photovoltaic devices that exhibit high current density without losing fill factor.

AB - Through a combination of chemical and mutual dot-to-dot surface passivation, high-quality colloidal quantum dot solids are fabricated. The joint passivation techniques lead to a record diffusion length for colloidal quantum dots of 230 ± 20 nm. The technique is applied to create thick photovoltaic devices that exhibit high current density without losing fill factor.

KW - colloidal quantum dots

KW - diffusion length

KW - surface passivation

KW - surface-to-volume ratio

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JF - Advanced Materials

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Record charge carrier diffusion length in colloidal quantum dot solids via mutual dot-to-dot surface passivation

Abstract

Keywords

ASJC Scopus subject areas

UN SDGs

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