Reflection by defective diffusion bonds

Jan Drewes Achenbach*, Y. Xu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

The reflection of ultrasonic wave motion by planar defect distributions is investigated with a view towards developing a method for detecting and characterizing bond-plane defects and with an ultimate objective of providing information on the bond strength of metal-to-metal bonds. The authors are primarily concerned with an approximate approach to analyzing reflection by cavities and cracks distributed in a bond plane. The results show some of the characteristic features of reflection with variation of such parameters as angle of incidence, frequency, defect size, defect shape, and defect spacing.

Original languageEnglish (US)
Pages (from-to)1107-1111
Number of pages5
JournalUltrasonics Symposium Proceedings
Volume2
StatePublished - Dec 1 1989
EventIEEE 1989 Ultrasonics Symposium - Montreal, Que, Can
Duration: Oct 3 1989Oct 6 1989

ASJC Scopus subject areas

  • Engineering(all)

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