Relative dielectric constant of epitaxial BaTiO 3 thin films in the GHz frequency range

T. Hamano*, D. J. Towner, Bruce W Wessels

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

The relative dielectric constant of an epitaxial BaTiO 3 thin film up to 40 GHz was determined from the measured phase shift and fitting to simulated data. The frequency dependence was found to obey a Curie-von Schweidler law over a frequency range of 0.25 to 40 GHz. Coplanar stripline (CPS) waveguides were formed on the BaTiO 3 films and the dielectric constant was determined by matching the reflection parameter by measurement with that by simulations. The results show that the measured microwave effective refractive index is 3.6 to 40 GHz for a CPS waveguide on the BaTiO 3/MgO structure.

Original languageEnglish (US)
Pages (from-to)5274-5276
Number of pages3
JournalApplied Physics Letters
Volume83
Issue number25
DOIs
StatePublished - Dec 22 2003

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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