Relative dielectric constant of epitaxial BaTiO 3 thin films in the GHz frequency range

T. Hamano; D. J. Towner; B. W. Wessels

doi:10.1063/1.1635967

Relative dielectric constant of epitaxial BaTiO ₃ thin films in the GHz frequency range

T. Hamano^*, D. J. Towner, B. W. Wessels

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

45 Scopus citations

Abstract

The relative dielectric constant of an epitaxial BaTiO ₃ thin film up to 40 GHz was determined from the measured phase shift and fitting to simulated data. The frequency dependence was found to obey a Curie-von Schweidler law over a frequency range of 0.25 to 40 GHz. Coplanar stripline (CPS) waveguides were formed on the BaTiO ₃ films and the dielectric constant was determined by matching the reflection parameter by measurement with that by simulations. The results show that the measured microwave effective refractive index is 3.6 to 40 GHz for a CPS waveguide on the BaTiO ₃/MgO structure.

Original language	English (US)
Pages (from-to)	5274-5276
Number of pages	3
Journal	Applied Physics Letters
Volume	83
Issue number	25
DOIs	https://doi.org/10.1063/1.1635967
State	Published - Dec 22 2003

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Relative dielectric constant of epitaxial BaTiO 3 thin films in the GHz frequency range",

abstract = "The relative dielectric constant of an epitaxial BaTiO 3 thin film up to 40 GHz was determined from the measured phase shift and fitting to simulated data. The frequency dependence was found to obey a Curie-von Schweidler law over a frequency range of 0.25 to 40 GHz. Coplanar stripline (CPS) waveguides were formed on the BaTiO 3 films and the dielectric constant was determined by matching the reflection parameter by measurement with that by simulations. The results show that the measured microwave effective refractive index is 3.6 to 40 GHz for a CPS waveguide on the BaTiO 3/MgO structure.",

author = "T. Hamano and Towner, {D. J.} and Wessels, {B. W.}",

year = "2003",

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TY - JOUR

T1 - Relative dielectric constant of epitaxial BaTiO 3 thin films in the GHz frequency range

AU - Hamano, T.

AU - Towner, D. J.

AU - Wessels, B. W.

PY - 2003/12/22

Y1 - 2003/12/22

N2 - The relative dielectric constant of an epitaxial BaTiO 3 thin film up to 40 GHz was determined from the measured phase shift and fitting to simulated data. The frequency dependence was found to obey a Curie-von Schweidler law over a frequency range of 0.25 to 40 GHz. Coplanar stripline (CPS) waveguides were formed on the BaTiO 3 films and the dielectric constant was determined by matching the reflection parameter by measurement with that by simulations. The results show that the measured microwave effective refractive index is 3.6 to 40 GHz for a CPS waveguide on the BaTiO 3/MgO structure.

AB - The relative dielectric constant of an epitaxial BaTiO 3 thin film up to 40 GHz was determined from the measured phase shift and fitting to simulated data. The frequency dependence was found to obey a Curie-von Schweidler law over a frequency range of 0.25 to 40 GHz. Coplanar stripline (CPS) waveguides were formed on the BaTiO 3 films and the dielectric constant was determined by matching the reflection parameter by measurement with that by simulations. The results show that the measured microwave effective refractive index is 3.6 to 40 GHz for a CPS waveguide on the BaTiO 3/MgO structure.

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JO - Applied Physics Letters

JF - Applied Physics Letters

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ER -

Relative dielectric constant of epitaxial BaTiO ₃ thin films in the GHz frequency range

Abstract

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