Reliability modeling and management of nanophotonic on-chip networks

Zheng Li*, Moustafa Mohamed, Xi Chen, Eric Dudley, Ke Meng, Li Shang, Alan R. Mickelson, Russell E Joseph, Manish Vachharajani, Brian Schwartz, Yihe Sun

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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