Resonance-enhanced x-rays in thin films: A structure probe for membranes and surface layers

Jin Wang*, Michael J. Bedzyk, Martin Caffrey

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

107 Scopus citations

Abstract

An x-ray resonance effect in an organic thin film on an x-ray reflecting mirror is reported. The resonance effect is the result of interference between reflected and refracted x-rays at the air-organic thin film interface and occurs at incident angles slightly above the critical angle of the film. In excellent agreement with theory, the primary resonant x-ray electric field that is confined in the organic thin film is ∼20 times as intense as the electric field of the incident beam when measured at a position close to the center of the film. Resonance-enhanced x-rays can be used to characterize the internal structure of Langmuir-Blodgett thin film membranes. This effect may also find use in x-ray-based thin film devices and in the structural analysis of adlayers and surfaces that have thus far proved difficult, if not impossible, to study because of sensitivity limitations.

Original languageEnglish (US)
Pages (from-to)775-778
Number of pages4
JournalScience
Volume258
Issue number5083
DOIs
StatePublished - 1992

ASJC Scopus subject areas

  • General

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