The bending modulus of amorphous SiO2 nanowires and the effects of electron trapping in the nanowires were investigated using mechanical resonance method. Under the electrical excitation of 3 KeV energy electrons significant charge trappings were observed in the nanowires. Nonuniform distribution of charge trapping and decay time in the nanowire suggested the use of a nondestructive method to study defects in certain types of nanostructures.
ASJC Scopus subject areas
- Physics and Astronomy(all)