Resonance vibration of amorphous SiO2 nanowires driven by mechanical or electrical field excitation

D. A. Dikin, X. Chen, W. Ding, G. Wagner, R. S. Ruoff*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

97 Scopus citations

Abstract

The bending modulus of amorphous SiO2 nanowires and the effects of electron trapping in the nanowires were investigated using mechanical resonance method. Under the electrical excitation of 3 KeV energy electrons significant charge trappings were observed in the nanowires. Nonuniform distribution of charge trapping and decay time in the nanowire suggested the use of a nondestructive method to study defects in certain types of nanostructures.

Original languageEnglish (US)
Pages (from-to)226-230
Number of pages5
JournalJournal of Applied Physics
Volume93
Issue number1
DOIs
StatePublished - Jan 1 2003

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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