Abstract
Dark current noise measurements were carried out between 10 and 10 4 Hz at T=80 K on two InGaAs/InP quantum well infrared photodetectors (QWIPs) designed for 8 μm infrared detection. Using the measured noise data, we have calculated the thermal generation rate, bias-dependant gain, electron trapping probability, and electron diffusion length. The calculated thermal generation rate (∼ 7.10 22 cm -3 s -1 ) is similar to AlGaAs/GaAs QWIPs with similar peak wavelengths, but the gain is 50 X larger, indicating improved transport and carrier lifetime are obtained in the binary InP barriers. As a result, a large responsivity of 7.5 A/W at 5 V bias and detectivity of 5×10 11 cm √Hz / W at 1.2 V bias were measured for the InGaAs/InP QWIPs at T=80 K.
Original language | English (US) |
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Pages (from-to) | 96-104 |
Number of pages | 9 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3287 |
DOIs | |
State | Published - Dec 1 1998 |
Event | Photodetectors: Materials and Devices III - San Jose, CA, United States Duration: Jan 28 1998 → Jan 30 1998 |
Keywords
- InGaAs
- InP
- Infrared detector
- Noise
- QWIP
- Quantum well
- Responsivity
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering