Retiming for soft error minimization under error-latching window constraints

Yinghai Lu, Hai Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Soft error has become a critical reliability issue in nano-scale integrated circuits, especially in sequential circuits where a latched error will be propagated for many cycles and affect many outputs at different time. Retiming is a structural operation that relocates registers in a circuit without changing its functionality. In this paper, the effect of retiming on soft error rate (SER) of a sequential circuit is investigated considering both logic masking and timing masking. A minimum observability retiming problem under error-latching window constraints is formulated to reduce the SER of the circuit. And an efficient algorithm is proposed to solve the problem optimally. Experimental results show on average a 32.7% reduction on SER from the original circuits and a 15% improvement over the existing method.

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe, DATE 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1008-1013
Number of pages6
ISBN (Print)9783981537000
DOIs
StatePublished - Jan 1 2013
Event16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013 - Grenoble, France
Duration: Mar 18 2013Mar 22 2013

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013
Country/TerritoryFrance
CityGrenoble
Period3/18/133/22/13

ASJC Scopus subject areas

  • Engineering(all)

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