@inproceedings{e3d8196f42584a2aaee88049563e5b1d,
title = "Retiming for soft error minimization under error-latching window constraints",
abstract = "Soft error has become a critical reliability issue in nano-scale integrated circuits, especially in sequential circuits where a latched error will be propagated for many cycles and affect many outputs at different time. Retiming is a structural operation that relocates registers in a circuit without changing its functionality. In this paper, the effect of retiming on soft error rate (SER) of a sequential circuit is investigated considering both logic masking and timing masking. A minimum observability retiming problem under error-latching window constraints is formulated to reduce the SER of the circuit. And an efficient algorithm is proposed to solve the problem optimally. Experimental results show on average a 32.7\% reduction on SER from the original circuits and a 15\% improvement over the existing method.",
author = "Yinghai Lu and Hai Zhou",
year = "2013",
doi = "10.7873/date.2013.210",
language = "English (US)",
isbn = "9783981537000",
series = "Proceedings -Design, Automation and Test in Europe, DATE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1008--1013",
booktitle = "Proceedings - Design, Automation and Test in Europe, DATE 2013",
address = "United States",
note = "16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013 ; Conference date: 18-03-2013 Through 22-03-2013",
}