Rigor, and plan-view simulation of surfaces

L. D. Marks*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

This paper discusses the rigor of simulating plan-view images of surfaces using numerical multislice calculations. In particular, the validity of using a conventional multislice approach with individual atomic slices is tested versus a three-dimensional multislice with the top and bottom surfaces specifically included; the result is that the two are identical when inelastic scattering is neglected and almost identical when it is included. These results also demonstrate that inelastic scattering cannot be neglected for surface plan-view simulations. For instance, the bulk-forbidden, surface-allowed spots are shown to correspond to true bulk Bloch waves which are damped in thicker crystals consistent with experimental observations. The existence of a strong top-bottom effect is also pointed out, which means that plan-view imaging is more sensitive to the bottom surface except in exceedingly thin crystals.

Original languageEnglish (US)
Pages (from-to)325-332
Number of pages8
JournalUltramicroscopy
Volume38
Issue number3-4
DOIs
StatePublished - Dec 1991

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Fingerprint

Dive into the research topics of 'Rigor, and plan-view simulation of surfaces'. Together they form a unique fingerprint.

Cite this