TY - JOUR
T1 - Rigorous formulation of oblique incidence scattering from dispersive media
AU - Zhang, Lingxiao
AU - Seideman, Tamar
PY - 2010/10/11
Y1 - 2010/10/11
N2 - We formulate a finite-difference time-domain approach to simulate electromagnetic wave scattering from scatterers embedded in layered dielectric or dispersive media. At the heart of our approach is a derivation of an equivalent one-dimensional wave-propagation equation for dispersive media characterized by a linear sum of Debye-, Drude-, and Lorentz-type poles. The derivation is followed by a detailed discussion of the simulation setup and numerical issues. The developed methodology is tested by comparison with analytical reflection and transmission coefficients for scattering from a slab, illustrating good convergence behavior. The case of scattering from a subwavelength slit in a dispersive thin film is explored to demonstrate the applicability of our formulation to time- and incident-angle-dependent analysis of surface waves generated by an obliquely incident plane wave.
AB - We formulate a finite-difference time-domain approach to simulate electromagnetic wave scattering from scatterers embedded in layered dielectric or dispersive media. At the heart of our approach is a derivation of an equivalent one-dimensional wave-propagation equation for dispersive media characterized by a linear sum of Debye-, Drude-, and Lorentz-type poles. The derivation is followed by a detailed discussion of the simulation setup and numerical issues. The developed methodology is tested by comparison with analytical reflection and transmission coefficients for scattering from a slab, illustrating good convergence behavior. The case of scattering from a subwavelength slit in a dispersive thin film is explored to demonstrate the applicability of our formulation to time- and incident-angle-dependent analysis of surface waves generated by an obliquely incident plane wave.
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U2 - 10.1103/PhysRevB.82.155117
DO - 10.1103/PhysRevB.82.155117
M3 - Article
AN - SCOPUS:78149231562
SN - 1098-0121
VL - 82
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 15
M1 - 155117
ER -