Abstract
Ga doping in indium zinc oxide (IZO)based amorphous-oxide semiconductors (AOSs) promotes the formation of oxidelattice structures with oxygen vacancies at low annealing temperatures, which is essential for acceptable thin-film-transistor performance (see figure). The mobility dependence on annealing temperature and AOS composition are analyzed and the chemical role of Ga is clarified, as required for solution-processed, lowtemperature-annealed AOSs.
Original language | English (US) |
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Pages (from-to) | 1346-1350 |
Number of pages | 5 |
Journal | Advanced Materials |
Volume | 22 |
Issue number | 12 |
DOIs | |
State | Published - Mar 26 2010 |
ASJC Scopus subject areas
- Mechanics of Materials
- Mechanical Engineering
- General Materials Science