Role of the underlying layer in crystalline structure and magnetic properties of Mn-Sb-Bi thin film

K. Kang*, A. K. Petford-Long

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Mn-Sb-Bi thin films were grown by deposition of Mn onto the annealed Sb/Bi bilayer. Changes in the morphology and structure of the films both as-sputtered and after annealing at 623 K for 5 h were observed. Annealing the Sb/Bi bilayer causes the Sb-Bi alloy with enlarged grains. Annealing Mn/(Sb-Bi) films shows a relatively high saturation magnetization, a small in-plane coercivity. The existence of the (001) orientation in the as-sputtered film produced by the intermediate annealing results in the better (001) orientation of the NiAs-type Mn-Sb-Bi phase in an annealed Mn/(Sb-Bi) thin film. The film shows the existence of the perpendicular anisotropy component.

Original languageEnglish (US)
Pages (from-to)212-220
Number of pages9
JournalThin Solid Films
Volume493
Issue number1-2
DOIs
StatePublished - Dec 22 2005

Keywords

  • Magnetic properties
  • Mn-Sb-Bi
  • Sputtering
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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