Safe limits for electron beam analysis of copper oxides

Amanda K. Petford-Long; Neil J. Long

doi:10.1016/0304-3991(90)90053-O

Safe limits for electron beam analysis of copper oxides

Amanda K. Petford-Long^*, Neil J. Long

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

As part of a wider study of transition metal oxides, CuO has been analysed using a STEM to determine the 'safe' limits of electron beam dose rate and total electron dose to which the material can be exposed before electron-beam-induced reduction occurs. Electron energy loss spectroscopy has been used to determine the change in composition of the oxide.

Original language	English (US)
Pages (from-to)	27-32
Number of pages	6
Journal	Ultramicroscopy
Volume	34
Issue number	1-2
DOIs	https://doi.org/10.1016/0304-3991(90)90053-O
State	Published - Nov 1990

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/0304-3991(90)90053-O

Cite this

@article{827fcfded5bd4222bfedec8f8727ff91,

title = "Safe limits for electron beam analysis of copper oxides",

abstract = "As part of a wider study of transition metal oxides, CuO has been analysed using a STEM to determine the 'safe' limits of electron beam dose rate and total electron dose to which the material can be exposed before electron-beam-induced reduction occurs. Electron energy loss spectroscopy has been used to determine the change in composition of the oxide.",

author = "Petford-Long, {Amanda K.} and Long, {Neil J.}",

year = "1990",

month = nov,

doi = "10.1016/0304-3991(90)90053-O",

language = "English (US)",

volume = "34",

pages = "27--32",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

number = "1-2",

}

TY - JOUR

T1 - Safe limits for electron beam analysis of copper oxides

AU - Petford-Long, Amanda K.

AU - Long, Neil J.

PY - 1990/11

Y1 - 1990/11

N2 - As part of a wider study of transition metal oxides, CuO has been analysed using a STEM to determine the 'safe' limits of electron beam dose rate and total electron dose to which the material can be exposed before electron-beam-induced reduction occurs. Electron energy loss spectroscopy has been used to determine the change in composition of the oxide.

AB - As part of a wider study of transition metal oxides, CuO has been analysed using a STEM to determine the 'safe' limits of electron beam dose rate and total electron dose to which the material can be exposed before electron-beam-induced reduction occurs. Electron energy loss spectroscopy has been used to determine the change in composition of the oxide.

UR - http://www.scopus.com/inward/record.url?scp=0025514215&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025514215&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(90)90053-O

DO - 10.1016/0304-3991(90)90053-O

M3 - Article

AN - SCOPUS:0025514215

SN - 0304-3991

VL - 34

SP - 27

EP - 32

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-2

ER -

Safe limits for electron beam analysis of copper oxides

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this