Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing

Brynmor J. Davis; W. Clem Karl; Bennett B. Goldberg; Anna K. Swan; M. Selim Ünlü

Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing

Brynmor J. Davis^*, W. Clem Karl, Bennett B. Goldberg, Anna K. Swan, M. Selim Ünlü

^*Corresponding author for this work

Physics and Astronomy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A multi-wavelength 3D fluorescence microscope, with transfer functions varying significantly with wavelength, is proposed. This microscope measures multiple wavelengths concurrently and scans through the object at a rate significantly below the Nyquist criterion, which gives a reduced image acquisition time. The sub-Nyquist sampling produces a set of images contaminated by aliasing. Due to the differing transfer functions, the aliasing effects are different in each image. This allows the aliasing operator to be inverted and a single unaliased image to be constructed. This is an application of the generalized sampling expansion first introduced by Papoulis. The instrument is demonstrated through simulation and shown to produce images of a similar quality to those that would be expected from a Nyquist-rate instrument.

Original language	English (US)
Title of host publication	2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop
Pages	329-333
Number of pages	5
State	Published - Dec 1 2004
Event	2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop - Taos Ski Valley, NM, United States Duration: Aug 1 2004 → Aug 4 2004

Publication series

Name	2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop

Other

Other	2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop
Country/Territory	United States
City	Taos Ski Valley, NM
Period	8/1/04 → 8/4/04

ASJC Scopus subject areas

Engineering(all)

Cite this

Davis, B. J., Karl, W. C., Goldberg, B. B., Swan, A. K., & Ünlü, M. S. (2004). Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing. In 2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop (pp. 329-333). (2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop).

Davis, Brynmor J. ; Karl, W. Clem ; Goldberg, Bennett B. et al. / Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing. 2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop. 2004. pp. 329-333 (2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop).

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title = "Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing",

abstract = "A multi-wavelength 3D fluorescence microscope, with transfer functions varying significantly with wavelength, is proposed. This microscope measures multiple wavelengths concurrently and scans through the object at a rate significantly below the Nyquist criterion, which gives a reduced image acquisition time. The sub-Nyquist sampling produces a set of images contaminated by aliasing. Due to the differing transfer functions, the aliasing effects are different in each image. This allows the aliasing operator to be inverted and a single unaliased image to be constructed. This is an application of the generalized sampling expansion first introduced by Papoulis. The instrument is demonstrated through simulation and shown to produce images of a similar quality to those that would be expected from a Nyquist-rate instrument.",

author = "Davis, {Brynmor J.} and Karl, {W. Clem} and Goldberg, {Bennett B.} and Swan, {Anna K.} and {\"U}nl{\"u}, {M. Selim}",

year = "2004",

month = dec,

day = "1",

language = "English (US)",

isbn = "0780384342",

series = "2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop",

pages = "329--333",

booktitle = "2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop",

note = "2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop ; Conference date: 01-08-2004 Through 04-08-2004",

}

Davis, BJ, Karl, WC, Goldberg, BB, Swan, AK & Ünlü, MS 2004, Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing. in 2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop. 2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop, pp. 329-333, 2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop, Taos Ski Valley, NM, United States, 8/1/04.

Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing. / Davis, Brynmor J.; Karl, W. Clem; Goldberg, Bennett B. et al.
2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop. 2004. p. 329-333 (2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing

AU - Davis, Brynmor J.

AU - Karl, W. Clem

AU - Goldberg, Bennett B.

AU - Swan, Anna K.

AU - Ünlü, M. Selim

PY - 2004/12/1

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N2 - A multi-wavelength 3D fluorescence microscope, with transfer functions varying significantly with wavelength, is proposed. This microscope measures multiple wavelengths concurrently and scans through the object at a rate significantly below the Nyquist criterion, which gives a reduced image acquisition time. The sub-Nyquist sampling produces a set of images contaminated by aliasing. Due to the differing transfer functions, the aliasing effects are different in each image. This allows the aliasing operator to be inverted and a single unaliased image to be constructed. This is an application of the generalized sampling expansion first introduced by Papoulis. The instrument is demonstrated through simulation and shown to produce images of a similar quality to those that would be expected from a Nyquist-rate instrument.

AB - A multi-wavelength 3D fluorescence microscope, with transfer functions varying significantly with wavelength, is proposed. This microscope measures multiple wavelengths concurrently and scans through the object at a rate significantly below the Nyquist criterion, which gives a reduced image acquisition time. The sub-Nyquist sampling produces a set of images contaminated by aliasing. Due to the differing transfer functions, the aliasing effects are different in each image. This allows the aliasing operator to be inverted and a single unaliased image to be constructed. This is an application of the generalized sampling expansion first introduced by Papoulis. The instrument is demonstrated through simulation and shown to produce images of a similar quality to those that would be expected from a Nyquist-rate instrument.

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T3 - 2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop

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Davis BJ, Karl WC, Goldberg BB, Swan AK, Ünlü MS. Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing. In 2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop. 2004. p. 329-333. (2004 IEEE 11th Digital Signal Processing Workshop and 2nd IEEE Signal Processing Education Workshop).

Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing

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