Scanning plasmon optical microscope

Y. K. Kim; P. M. Lundquist; J. A. Helfrich; J. M. Mikrut; G. K. Wong; P. R. Auvil; J. B. Ketterson

doi:10.1063/1.113369

Scanning plasmon optical microscope

Y. K. Kim^*, P. M. Lundquist, J. A. Helfrich, J. M. Mikrut, G. K. Wong, P. R. Auvil, J. B. Ketterson

^*Corresponding author for this work

MRC - Materials Research Center

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

A new scanning near-field optical microscopy based on the surface plasmon resonance is presented. Enhanced fields are localized at individual surface irregularities by the scattering of plasmons and the scattered plasmons produce a conical radiation. Variations in the conical radiation intensity caused by interactions between a raster-scanned probe tip and the enhanced fields are recorded and related to the surface topography, providing an optical image with lateral resolution exceeding the diffraction limit. This technique is compared to complementary atomic force microscopy and scanning tunneling microscopy measurements and potential advantages are discussed.

Original language	English (US)
Pages (from-to)	3407
Number of pages	1
Journal	Applied Physics Letters
DOIs	https://doi.org/10.1063/1.113369
State	Published - 1995

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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@article{177bbbe49724430995231570ed19f747,

title = "Scanning plasmon optical microscope",

abstract = "A new scanning near-field optical microscopy based on the surface plasmon resonance is presented. Enhanced fields are localized at individual surface irregularities by the scattering of plasmons and the scattered plasmons produce a conical radiation. Variations in the conical radiation intensity caused by interactions between a raster-scanned probe tip and the enhanced fields are recorded and related to the surface topography, providing an optical image with lateral resolution exceeding the diffraction limit. This technique is compared to complementary atomic force microscopy and scanning tunneling microscopy measurements and potential advantages are discussed.",

author = "Kim, {Y. K.} and Lundquist, {P. M.} and Helfrich, {J. A.} and Mikrut, {J. M.} and Wong, {G. K.} and Auvil, {P. R.} and Ketterson, {J. B.}",

year = "1995",

doi = "10.1063/1.113369",

language = "English (US)",

pages = "3407",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

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TY - JOUR

T1 - Scanning plasmon optical microscope

AU - Kim, Y. K.

AU - Lundquist, P. M.

AU - Helfrich, J. A.

AU - Mikrut, J. M.

AU - Wong, G. K.

AU - Auvil, P. R.

AU - Ketterson, J. B.

PY - 1995

Y1 - 1995

N2 - A new scanning near-field optical microscopy based on the surface plasmon resonance is presented. Enhanced fields are localized at individual surface irregularities by the scattering of plasmons and the scattered plasmons produce a conical radiation. Variations in the conical radiation intensity caused by interactions between a raster-scanned probe tip and the enhanced fields are recorded and related to the surface topography, providing an optical image with lateral resolution exceeding the diffraction limit. This technique is compared to complementary atomic force microscopy and scanning tunneling microscopy measurements and potential advantages are discussed.

AB - A new scanning near-field optical microscopy based on the surface plasmon resonance is presented. Enhanced fields are localized at individual surface irregularities by the scattering of plasmons and the scattered plasmons produce a conical radiation. Variations in the conical radiation intensity caused by interactions between a raster-scanned probe tip and the enhanced fields are recorded and related to the surface topography, providing an optical image with lateral resolution exceeding the diffraction limit. This technique is compared to complementary atomic force microscopy and scanning tunneling microscopy measurements and potential advantages are discussed.

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U2 - 10.1063/1.113369

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SN - 0003-6951

SP - 3407

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -

Scanning plasmon optical microscope

Abstract

ASJC Scopus subject areas

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