Scanning soft X-ray microscopy and diffraction imaging

Janos Kirz; Tobias Beetz; Michael Feser; Holger Fleckenstein; Benjamin Hornberger; Malcolm Howells; Chris Jacobsen; Bjorg Larson; Mirna Lerotic; Enju Lima; Ming Lu; Huijie Miao; David Sayre; David Shapiro; Aaron Stein; Yefim Sheynkin; Sue Wirick

doi:10.1017/S1431927604882746

Scanning soft X-ray microscopy and diffraction imaging

Janos Kirz^*, Tobias Beetz, Michael Feser, Holger Fleckenstein, Benjamin Hornberger, Malcolm Howells, Chris Jacobsen, Bjorg Larson, Mirna Lerotic, Enju Lima, Ming Lu, Huijie Miao, David Sayre, David Shapiro, Aaron Stein, Yefim Sheynkin, Sue Wirick

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	120-121
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604882746
State	Published - 2004

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927604882746

Cite this

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title = "Scanning soft X-ray microscopy and diffraction imaging",

author = "Janos Kirz and Tobias Beetz and Michael Feser and Holger Fleckenstein and Benjamin Hornberger and Malcolm Howells and Chris Jacobsen and Bjorg Larson and Mirna Lerotic and Enju Lima and Ming Lu and Huijie Miao and David Sayre and David Shapiro and Aaron Stein and Yefim Sheynkin and Sue Wirick",

year = "2004",

doi = "10.1017/S1431927604882746",

language = "English (US)",

volume = "10",

pages = "120--121",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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TY - JOUR

T1 - Scanning soft X-ray microscopy and diffraction imaging

AU - Kirz, Janos

AU - Beetz, Tobias

AU - Feser, Michael

AU - Fleckenstein, Holger

AU - Hornberger, Benjamin

AU - Howells, Malcolm

AU - Jacobsen, Chris

AU - Larson, Bjorg

AU - Lerotic, Mirna

AU - Lima, Enju

AU - Lu, Ming

AU - Miao, Huijie

AU - Sayre, David

AU - Shapiro, David

AU - Stein, Aaron

AU - Sheynkin, Yefim

AU - Wirick, Sue

PY - 2004

Y1 - 2004

UR - http://www.scopus.com/inward/record.url?scp=4544352271&partnerID=8YFLogxK

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U2 - 10.1017/S1431927604882746

DO - 10.1017/S1431927604882746

M3 - Article

AN - SCOPUS:4544352271

SN - 1431-9276

VL - 10

SP - 120

EP - 121

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Scanning soft X-ray microscopy and diffraction imaging

ASJC Scopus subject areas

Access to Document

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