Scanning soft X-ray microscopy and diffraction imaging

Janos Kirz*, Tobias Beetz, Michael Feser, Holger Fleckenstein, Benjamin Hornberger, Malcolm Howells, Chris Jacobsen, Bjorg Larson, Mirna Lerotic, Enju Lima, Ming Lu, Huijie Miao, David Sayre, David Shapiro, Aaron Stein, Yefim Sheynkin, Sue Wirick

*Corresponding author for this work

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)120-121
Number of pages2
JournalMicroscopy and Microanalysis
Volume10
Issue numberSUPPL. 2
DOIs
StatePublished - Sep 24 2004

ASJC Scopus subject areas

  • Instrumentation

Cite this

Kirz, J., Beetz, T., Feser, M., Fleckenstein, H., Hornberger, B., Howells, M., Jacobsen, C., Larson, B., Lerotic, M., Lima, E., Lu, M., Miao, H., Sayre, D., Shapiro, D., Stein, A., Sheynkin, Y., & Wirick, S. (2004). Scanning soft X-ray microscopy and diffraction imaging. Microscopy and Microanalysis, 10(SUPPL. 2), 120-121. https://doi.org/10.1017/S1431927604882746