Scanning soft X-ray microscopy and diffraction imaging

Janos Kirz*, Tobias Beetz, Michael Feser, Holger Fleckenstein, Benjamin Hornberger, Malcolm Howells, Chris Jacobsen, Bjorg Larson, Mirna Lerotic, Enju Lima, Ming Lu, Huijie Miao, David Sayre, David Shapiro, Aaron Stein, Yefim Sheynkin, Sue Wirick

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


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