Scanning transmission soft x-ray microscopy at beamline X-1A at the NSLS - Advances in instrumentation and selected applications

Michael Feser, Tobias Beetz, Chris Jacobsen, Janos Kirz, Sue Wirick, Aaron Stein, Thorsten Schäfer

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

Soft x-ray scanning transmission x-ray microscopy allows one to image dry and wet environmental science, biological, polymer, and geochemical specimens on a nanoscale. Recent advances in instrumentation at the X-1A beamline at the National Synchrotron Light Source at Brookhaven National Laboratory are described. Recent results on Nomarski differential phase contrast and first results of investigations at the oxygen K edge and iron L edge of hydrous ferric oxide transformations are presented.

Original languageEnglish (US)
Pages (from-to)146-153
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4506
DOIs
StatePublished - Jan 1 2001

Keywords

  • Scanning transmission x-ray microscopy
  • Soft x-ray spectroscopy
  • Spectromicroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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