Scanning transmission x-ray microscope at the NSLS: from XANES to cryo

Jorg M. Maser*, Henry N. Chapman, Chris J. Jacobsen, Alex Kalinovsky, Janos Kirz, Angelika Osanna, Steve Spector, Steve Wang, Barry Winn, Sue Wirick, Xiaodong Zhang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

The Stony Brook scanning transmission x-ray microscope (STXM) has been operating at the X1A beamline at the NSLS since 1989. A large number of users have used it to study biological and material science samples. We report on changes that have been performed in the past year, and present recent results. To stabilize the position of the micro probe when doing spectral scans at high spatial resolution, we have constructed a piezo-driven flexure stage which carries out the focusing motion of the zone plate needed when changing the wavelength. To overcome our detector limitation set by saturation of our gas-flow counter at count rates around 1 MHz, we are installing an avalanche photo diode with an active quenching circuit which we expect to respond linearly to count rates in excess of 10 MHz. We have improved the enclosure for STXM to improve the stability of the Helium atmosphere while taking data. This reduces fluctuations of beam absorption and, therefore, noise in the image. A fast shutter has been installed in the beam line. We are also developing a cryo- STXM which is designed for imaging frozen hydrated samples at temperatures below 120 K. At low temperatures, radiation sensitive samples can tolerate a considerably higher radiation dose than at room temperature. This should improve the resolution obtainable from biological samples and should make recording of multiple images of the same sample area possible while minimizing the effects of radiation damage. This should enable us to perform elemental and chemical mapping at high resolution, and to record the large number of views needed for 3D reconstruction of the object.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages78-89
Number of pages12
StatePublished - Dec 1 1995
EventX-Ray Microbeam Technology and Applications - San Diego, CA, USA
Duration: Jul 11 1995Jul 12 1995

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2516
ISSN (Print)0277-786X

Other

OtherX-Ray Microbeam Technology and Applications
CitySan Diego, CA, USA
Period7/11/957/12/95

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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