Scanning tunneling microscopy of Si/SiO2 interface roughness and its dependence on growth conditions

G. S. Shekhawat*, Ram P. Gupta, S. S. Shekhawat, D. P. Runthala, P. D. Vyas, P. Srivastava, S. Venkatesh, K. Mamhoud, K. B. Garg

*Corresponding author for this work

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Physics & Astronomy