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Scanning tunneling microscopy of Si/SiO2 interface roughness and its dependence on growth conditions
G. S. Shekhawat*, Ram P. Gupta, S. S. Shekhawat, D. P. Runthala, P. D. Vyas, P. Srivastava, S. Venkatesh, K. Mamhoud, K. B. Garg
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review