Scanning tunneling optical spectroscopy of semiconductor thin films and quantum wells

Bruce W Wessels*, L. Q. Qian

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Scanning tunneling optical spectroscopy is used to study the sirfaces of semiconductors. The mechanisms for the interaction between light and the tunnel junction are assessed. Measurements of optical transitions in quantum well structures were conducted and the results are found to agree with theoretical calculations.

Original languageEnglish (US)
Pages (from-to)1803-1806
Number of pages4
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume10
Issue number4
DOIs
StatePublished - Jul 1 1992

ASJC Scopus subject areas

  • Engineering(all)

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