Second-harmonic generation in rf sputter-deposited AIN thin films

P. M. Lundquist*, W. P. Lin, E. D. Rippert, John B Ketterson, G. K. Wong

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The optical second harmonic generation (SHG) in AlN thin films was investigated. AlN thin films were grown on sapphire substrates by rf magnetron sputtering. SHG measurements were carried out using Q switched YAG laser to determine magnitude of second order electric susceptibility. Frequency dependence was determined using tunable radiation from an optical parametric amplifier. The magnitude of χ(2) was found to increase as the wavelength decreases. The refractive index was observed to be higher than the sapphire substrates which allows the use of AlN as optical waveguides.

Original languageEnglish (US)
Title of host publicationConference Proceedings - Lasers and Electro-Optics Society Annual Meeting
PublisherPubl by IEEE
ISBN (Print)0780319710
StatePublished - Jan 1 1994
EventProceedings of the Conference on Lasers and Electro-Optics - Anaheim, CA, USA
Duration: May 8 1994May 13 1994

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting
Volume8

Other

OtherProceedings of the Conference on Lasers and Electro-Optics
CityAnaheim, CA, USA
Period5/8/945/13/94

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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