Seeing inside chips and cells: High-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures

Bennett B. Goldberg; A. K. Swan; L. Moiseev; M. Dogan; W. C. Karl; B. Davis; C. R. Cantor; S. B. Ippolito; S. A. Thorne; M. G. Eraslan; Z. Liu; M. B. Goldberg; M. S. Ünlü; Y. Leblebici

Seeing inside chips and cells: High-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures

Bennett B. Goldberg^*, A. K. Swan, L. Moiseev, M. Dogan, W. C. Karl, B. Davis, C. R. Cantor, S. B. Ippolito, S. A. Thorne, M. G. Eraslan, Z. Liu, M. B. Goldberg, M. S. Ünlü, Y. Leblebici

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Conference article › peer-review

Abstract

In this work we examine two general approaches to subsurface imaging, the first using solid immersion lens technology to optimize the numerical aperture and the second an interferometric spectral fluorescence technique for buried emitters.

Original language	English (US)
Pages (from-to)	673-674
Number of pages	2
Journal	OSA Trends in Optics and Photonics Series
Volume	97
State	Published - 2004
Event	International Quantum Electronics Conference, IQEC - San Francisco, CA, United States Duration: May 21 2004 → May 26 2004

Keywords

Fluorescence imaging
High-resolution
Spectroscopy
Thermal imaging

ASJC Scopus subject areas

General Engineering

Cite this

Goldberg, B. B., Swan, A. K., Moiseev, L., Dogan, M., Karl, W. C., Davis, B., Cantor, C. R., Ippolito, S. B., Thorne, S. A., Eraslan, M. G., Liu, Z., Goldberg, M. B., Ünlü, M. S., & Leblebici, Y. (2004). Seeing inside chips and cells: High-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures. OSA Trends in Optics and Photonics Series, 97, 673-674.

@article{e4127a1a69a34018af2cdb8e8cc6f81a,

title = "Seeing inside chips and cells: High-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures",

abstract = "In this work we examine two general approaches to subsurface imaging, the first using solid immersion lens technology to optimize the numerical aperture and the second an interferometric spectral fluorescence technique for buried emitters.",

keywords = "Fluorescence imaging, High-resolution, Spectroscopy, Thermal imaging",

author = "Goldberg, {Bennett B.} and Swan, {A. K.} and L. Moiseev and M. Dogan and Karl, {W. C.} and B. Davis and Cantor, {C. R.} and Ippolito, {S. B.} and Thorne, {S. A.} and Eraslan, {M. G.} and Z. Liu and Goldberg, {M. B.} and {\"U}nl{\"u}, {M. S.} and Y. Leblebici",

year = "2004",

language = "English (US)",

volume = "97",

pages = "673--674",

journal = "OSA Trends in Optics and Photonics Series",

issn = "1094-5695",

note = "International Quantum Electronics Conference, IQEC ; Conference date: 21-05-2004 Through 26-05-2004",

}

TY - JOUR

T1 - Seeing inside chips and cells

T2 - International Quantum Electronics Conference, IQEC

AU - Goldberg, Bennett B.

AU - Swan, A. K.

AU - Moiseev, L.

AU - Dogan, M.

AU - Karl, W. C.

AU - Davis, B.

AU - Cantor, C. R.

AU - Ippolito, S. B.

AU - Thorne, S. A.

AU - Eraslan, M. G.

AU - Liu, Z.

AU - Goldberg, M. B.

AU - Ünlü, M. S.

AU - Leblebici, Y.

PY - 2004

Y1 - 2004

N2 - In this work we examine two general approaches to subsurface imaging, the first using solid immersion lens technology to optimize the numerical aperture and the second an interferometric spectral fluorescence technique for buried emitters.

AB - In this work we examine two general approaches to subsurface imaging, the first using solid immersion lens technology to optimize the numerical aperture and the second an interferometric spectral fluorescence technique for buried emitters.

KW - Fluorescence imaging

KW - High-resolution

KW - Spectroscopy

KW - Thermal imaging

UR - http://www.scopus.com/inward/record.url?scp=33645239316&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33645239316&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:33645239316

SN - 1094-5695

VL - 97

SP - 673

EP - 674

JO - OSA Trends in Optics and Photonics Series

JF - OSA Trends in Optics and Photonics Series

Y2 - 21 May 2004 through 26 May 2004

ER -

Seeing inside chips and cells: High-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures

Abstract

Keywords

ASJC Scopus subject areas

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