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Seeing inside chips and cells: High-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures
Bennett B. Goldberg*, A. K. Swan, L. Moiseev, M. Dogan, W. C. Karl, B. Davis, C. R. Cantor, S. B. Ippolito, S. A. Thorne, M. G. Eraslan, Z. Liu, M. B. Goldberg, M. S. Ünlü, Y. Leblebici
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review